Nondestructive evaluation of large-area PZN-8%PT single crystal wafers for medical ultrasound imaging probe applications

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control

Volumn 50, Issue 3, 2003, Pages 203-209

  Kumar, Francis J ^a   Lim, Leong Chew ^a,b   Lim, Siak Piang ^b   Lee, Kwok Hong ^a  

^a Microfine Materials Technologies P/L   (Singapore)

^b NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL GROWTH; DIELECTRIC LOSSES; LEAD COMPOUNDS; MEDICAL IMAGING; PROBES; SINGLE CRYSTALS; TEMPERATURE DISTRIBUTION; TEMPERATURE MEASUREMENT; ULTRASONIC IMAGING;

CURIE TEMPERATURE; LEAD ZINC NIOBATE TITANATE; SLOW COOLING FLUX TECHNIQUE;

FERROELECTRIC MATERIALS;

LEAD; LEAD ZINC NIOBATE TITANATE; NIOBIUM; TITANIUM; ZINC;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; CRYSTALLOGRAPHY; ECHOGRAPHY; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRODE; EVALUATION; INSTRUMENTATION; MATERIALS TESTING; METHODOLOGY; QUALITY CONTROL; SENSITIVITY AND SPECIFICITY; TEMPERATURE; TRANSDUCER;

CRYSTALLIZATION; CRYSTALLOGRAPHY; ELECTRIC CONDUCTIVITY; ELECTROCHEMISTRY; ELECTRODES; LEAD; MATERIALS TESTING; NIOBIUM; QUALITY CONTROL; SENSITIVITY AND SPECIFICITY; TEMPERATURE; TITANIUM; TRANSDUCERS; ULTRASONOGRAPHY; ZINC;

EID: 0038284391     PISSN: 08853010     EISSN: None     Source Type: Journal    
DOI: 10.1109/TUFFC.2003.1193612     Document Type: Article

References (19)

1. 3 system," Ferroelectrics, vol. 37, pp. 579-582, 1981.
2. 3 single crystals," Jpn. J. Appl. Phys., vol. 21, pp. 1298-1302, 1982.
3. Y. Yamashita, "Large electromechanical coupling factors in perovskite binary material system," Jpn. J. Appl. Phys., vol. 33, pp. 5328-5331, 1994.
4. S.-E. Park and T. R. Shrout, "Ultrahigh strain and piezoelectric behavior in relaxor based ferroelectric single crystals," J. Appl. Phys., vol. 82, pp. 1804-1811, 1997.
5. S.-E. Park and T. R. Shrout, "Characteristics of relaxor-based piezoelectric single crystals for ultrasonic transducers," IEEE Trans. Ultrason., Ferroelectr., Freq. Contr., vol. 44, pp. 1140-1147, 1997.
6. 3 single crystal," Jpn. J. Appl. Phys., vol. 37, pp. 3053-3057, 1998.
7. 3 single crystal," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 45, pp. 1071-1076, 1998.
8. 3 single crystal," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 46, pp. 414-421, 1999.
9. 3 single crystal," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 46, pp. 152-157, 1999.
10. T. Ritter, X. Geng, K. K. Shung, P. D. Lopath, S.-E. Park, and T. R. Shrout, "Single crystal PZN-PT-polymer composites for ultrasound transducer applications," IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 47, pp. 792-800, 2000.
11. C. G. Oakley and M. J. Zipparo, "Single crystal piezoelectrics: A revolutionary development for transducers," in Proc. IEEE Ultrason. Symp., 2000, pp. 1157-1167.
12. L. C. Lim, F. J. Kumar, and A. Amin, "Trapped metastable phases in PZN-(8-9)%PT single crystal wafers," J. Appl. Phys., Apr. 2003, accepted for publication.
13. 3," Jpn. J. Appl. Phys., vol. 37, pp. 5246-5248, 1998.
14. L. C. Lim and F. J. Kumar, "Non-destructive evaluation of compositional and property distribution in large-size relaxor single crystal wafers," in Proc. IEEE Ultrason. Symp., Oct. 7-10, 2001, pp. 1043-1046.
15. F. J. Kumar, L. C. Lim, C. Chilong, and M. J. Tan, "Morphological aspects of flux grown 0.91PZN-0.09PT crystals," J. Cryst. Growth, vol. 216, pp. 311-316, 2000.
16. 3 system grown by the vertical Bridgman method and its characterisation," Jpn. J. Appl. Phys., vol. 37, pp. 3382-3385, 1998.
17. IEEE Standard on Piezoelectricity, ANSI/IEEE Std. 176-1987, New York: The Institute of Electrical and Electronics Engineers, 1987, p. 32.
18. W. G. Cady, Piezoelectricity; An Introduction to the Theory and Applications of Electromechanical Phenomena in Crystals. New York: McGraw-Hill, 1946, pp. 333-405.
19. R. Bechmann and P. L. Parsons, Selected Engineering Reports-Piezoelectricity. London: Her Majesty's Stationary Office, 1957, pp. 63-72, pp. 293-320.