Non-destructive evaluation of compositional and property distributions in large-size relaxor single crystal wafers

Proceedings of the IEEE Ultrasonics Symposium

Volumn 2, Issue , 2001, Pages 1043-1046

  Lim, L C ^a   Kumar, F J ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

COMPOSITION; CRYSTAL GROWTH; LEAD COMPOUNDS; NONDESTRUCTIVE EXAMINATION; SINGLE CRYSTALS; TEMPERATURE DISTRIBUTION;

CURIE TEMPERATURE; LEAD TITANATE; LEAD ZINC NIOBATE; SINGLE CRYSTAL WAFERS;

ULTRASONIC TESTING;

EID: 0035731106     PISSN: 10510117     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

1. Can relaxor piezoelectric materials outperform PZT? (Review)
2. 2+)
3. Characteristics of relaxor-based piezoelectric single crystals for ultrasonic transducers
4. 3 single crystal
5. 3 single crystal
6. Proc. IEEE Ultrasonics Symposium, 2000
7. Growth of large and homogeneous PZN-PT single crystals for medical ultrasonic array transducers
8. Morphological aspects of flux grown 0.91PZN-0.09PT crystals
9. Electromechanical response of [001] oriented single crystal lead zinc niobate titanate: DC bias and temperature effects