Vertically etched silicon as 1D photonic crystal

Physica Status Solidi (A) Applied Research

Volumn 197, Issue 2, 2003, Pages 544-548

  Tolmachev, V A ^a   Perova, T S ^b   Astrova, E V ^a   Volchek, B Z ^c   Vij, J K ^b  

^a IOFFE INSTITUTE   (Russian Federation)

^b TRINITY COLLEGE DUBLIN   (Ireland)

^c INSTITUTE OF MACROMOLECULAR COMPOUNDS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; COMPUTER SIMULATION; ETCHING; FILM PREPARATION; LATTICE CONSTANTS; OPTICAL MATERIALS; REFRACTIVE INDEX; SPECTRUM ANALYSIS;

BAND GAP; ELECTROMAGNETIC SPECTRUM; PHOTONIC CRYSTAL;

SEMICONDUCTING SILICON;

EID: 0038270701     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/pssa.200306561     Document Type: Conference Paper

References (7)

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7. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light, ch. 4, (North-Holland Publ. Co., Amsterdam, 1977).