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Volumn 53, Issue 2, 2003, Pages 111-119

Extraction of optical parameters of thin films from spectral measurements for design and optical performance of multilayer structures

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[No Author keywords available]

Indexed keywords

EID: 0038245328 PISSN: 03230465 EISSN: None Source Type: Journal
DOI: None Document Type: Conference Paper

Times cited : (2)

References (12)

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