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Volumn 34, Issue 2, 2003, Pages 109-118

Small metal nanoparticle recognition using digital image analysis and high resolution electron microscopy

Author keywords

Image analysis and processing; Nanotechnology; Pattern recognition

Indexed keywords


EID: 0038236970     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0968-4328(03)00006-4     Document Type: Article
Times cited : (22)

References (13)
  • 4
    • 85031152292 scopus 로고    scopus 로고
    • PhD Thesis Disertation. ININ-UAEM, Mexico
    • Ascencio JA. PhD Thesis Disertation. ININ-UAEM, Mexico; 2000.
    • (2000)
    • Ascencio, J.A.1
  • 9
    • 4243926434 scopus 로고    scopus 로고
    • Electron microscopy and its application to the study of archaeological materials and art preservation, analytical methods in art and archeology
    • Wiley, New York
    • José-Yacamán, M., Ascencio, J.A., 2000. Electron Microscopy and its Application to the Study of Archaeological Materials and Art Preservation, Analytical Methods in Art and Archeology. Chemical Analysis Series, vol. 155. Wiley, New York.
    • (2000) Chemical Analysis Series , vol.155
    • José-Yacamán, M.1    Ascencio, J.A.2
  • 12
    • 0038437098 scopus 로고
    • Classification of particles in noisy electron micrographs using correspondence analysis
    • Gelsema, E.S., Kanal, L.N. (Eds.), North-Holland, New York
    • Van Heel, M., Frank, J., 1980. Classification of particles in noisy electron micrographs using correspondence analysis. In: Gelsema, E.S., Kanal, L.N. (Eds.), Pattern Recognition in Practice, North-Holland, New York, pp. 235-243.
    • (1980) Pattern Recognition in Practice , pp. 235-243
    • Van Heel, M.1    Frank, J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.