Two ions in one trap: Ultra-high precision mass spectrometry?

IEEE Transactions on Instrumentation and Measurement

Volumn 52, Issue 2, 2003, Pages 292-296

  Rainville, Simon ^a   Thompson, James K ^a   Pritchard, David E ^a  

^a MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Fundamental constants; Mass spectroscopy; Metrology; Penning trap

Indexed keywords

ELECTRON TRAPS; FREQUENCIES; IONS; MAGNETIC FIELD EFFECTS; MAGNETRONS; MOLECULAR WEIGHT; OPTICAL VARIABLES MEASUREMENT; SYSTEMATIC ERRORS;

CYCLOTRON FREQUENCIES; FUNDAMENTAL CONSTANTS; ION TRAP; PENNING TRAP; ULTRA HIGH PRECISION MASS SPECTROMETRY;

MASS SPECTROMETRY;

EID: 0038236968     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2003.810725     Document Type: Article

References (8)

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