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Volumn 1, Issue 4-5, 2001, Pages 379-384

Improvement by surface modification of Ir electrode-barrier for Pb(Zr,Ti) O3 -based high-density nonvolatile ferroelectric memories

Author keywords

77.84. s; Electrode barrier; Polarization fatigue free; PZT thin film capacitors; Surface modification of Ir

Indexed keywords


EID: 0038229285     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1567-1739(01)00039-6     Document Type: Article
Times cited : (7)

References (15)
  • 12
    • 0041751569 scopus 로고    scopus 로고
    • Ferroelectric Thin Films VII
    • in: R.E. Jones, R.W. Schwartz, S.R. Summerfelt, I.K. Yoo (Eds.), Boston, MA
    • K.L. Saeger, A. Grill, T.M. Shaw, D.A. Neumayer, C. Lin, Y.Y. Wang, in: R.E. Jones, R.W. Schwartz, S.R. Summerfelt, I.K. Yoo (Eds.), Ferroelectric Thin Films VII, Mater. Res. Soc. Proc., vol. 541, Boston, MA, 1998, p. 119.
    • (1998) Mater. Res. Soc. Proc. , vol.541 , pp. 119
    • Saeger, K.L.1    Grill, A.2    Shaw, T.M.3    Neumayer, D.A.4    Lin, C.5    Wang, Y.Y.6
  • 15
    • 0041751568 scopus 로고    scopus 로고
    • Ferroelectric Thin Films VI
    • in: R.E. Treece, R.E. Jones, C.M. Foster, S.B. Desu, I.K. Yoo (Eds.), Boston, MA
    • M. Shimizu, H. Fujisawa, S. Hyodo, S. Nakashima, H. Niu, H. Okino, T. Shiosaki, in: R.E. Treece, R.E. Jones, C.M. Foster, S.B. Desu, I.K. Yoo (Eds.), Ferroelectric Thin Films VI, Mater. Res. Soc. Proc., vol. 493, Boston, MA, 1997, p. 159.
    • (1997) Mater. Res. Soc. Proc. , vol.493 , pp. 159
    • Shimizu, M.1    Fujisawa, H.2    Hyodo, S.3    Nakashima, S.4    Niu, H.5    Okino, H.6    Shiosaki, T.7


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.