Scanning probe microscope observation of recorded marks in phase change disks

Microscopy and Microanalysis

Volumn 7, Issue 4, 2001, Pages 363-367

  Kikukawa, Takashi ^a   Utsunomiya, Hajime ^a  

^a TDK CORPORATION   (Japan)

Author keywords

Amorphous mark; Novel readout system; Phase change disk; Scanning probe microscopy; Surface potential mode; Transmission electron microscopy

Indexed keywords

EID: 0038222717     PISSN: 14319276     EISSN: None     Source Type: Journal    
DOI: 10.1017/S1431927601010352     Document Type: Article

References (3)

1. Betzig E, Finn PL, Weiner JS (1992) Combined shear force and near-field scanning optical microscopy. Appl Phys Lett 60:2484-2486
2. Tominaga J, Nakano T, Atoda N (1998) An approach for recording and readout beyond the diffraction limit with an Sb film. Appl Phys Lett 73:2078-2080
3. Shintani T, Terao M, Yamamoto H, Naito T (1999) A new super-resolution film applicable to read-only and rewritable optical disks. Jpn J Appl Phys 38:1656-1660