Direct determination by low-energy electron diffraction of the atomic structure of surface layers on a known substrate

Physical Review B - Condensed Matter and Materials Physics

Volumn 67, Issue 12, 2003, Pages

  Seubert, A ^a   Heinz, K ^a   Saldin, D K ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b UNIVERSITY OF WISCONSIN MILWAUKEE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; ALGORITHM; ARTICLE; ATOM; ATOMIC PARTICLE; DYNAMICS; ELECTRON DIFFRACTION; ENERGY; ENTROPY; HOLOGRAPHY; MATHEMATICAL ANALYSIS; SIMULATION; WAVEFORM;

EID: 0038219552     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.67.125417     Document Type: Article

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