X-ray structural phase analysis of CdTe semiconductor annealed in air

Crystal Research and Technology

Volumn 38, Issue 6, 2003, Pages 488-493

  Heiba, Z K ^a  

^a Ain Shams University   (Egypt)

Author keywords

Cadmium chalcogenides; Semiconductor oxidation; X ray quantitative analysis

Indexed keywords

ANNEALING; CADMIUM COMPOUNDS; OXIDATION; X RAY ANALYSIS;

X-RAY STRUCTURAL PHASE ANALYSIS;

SEMICONDUCTOR MATERIALS;

EID: 0038209820     PISSN: 02321300     EISSN: None     Source Type: Journal    
DOI: 10.1002/crat.200310061     Document Type: Article

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