X-ray quantitative analysis of the phases developed upon air annealing of ZnSe, CdSe, and CdS semiconductors

Powder Diffraction

Volumn 17, Issue 3, 2002, Pages 191-195

  Heiba, Zein K ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

Author keywords

Semiconductor oxidation; X ray quantitative analysis; Zinc and cadmium chalcogenides

Indexed keywords

CHALCOGENIDES;

ANNEALING; OXIDATION; PHASE COMPOSITION; RATE CONSTANTS; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; THERMAL EFFECTS; X RAY ANALYSIS;

SEMICONDUCTING CADMIUM COMPOUNDS;

EID: 0036745854     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.1487862     Document Type: Article

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