-
1
-
-
0003788740
-
-
2nd ed., Imperial College Press, London
-
T.R. Thomas, Rough Surfaces 2nd ed., Imperial College Press, London, 1999.
-
(1999)
Rough Surfaces
-
-
Thomas, T.R.1
-
4
-
-
0027539466
-
Measurement of surface roughness on rough machined surfaces using spectral speckle correlation and image analysis
-
Persson U.Measurement of surface roughness on rough machined surfaces using spectral speckle correlation and image analysis Wear 160 1993 221-225
-
(1993)
Wear
, vol.160
, pp. 221-225
-
-
Persson, U.1
-
5
-
-
0033075692
-
Characterization of surface roughness by laser scattering: Diffusely scattered intensity measurement
-
Le Bosse J.C.Hansali G.Lopez J.Dumas J.C.Characterization of surface roughness by laser scattering: diffusely scattered intensity measurement Wear 224 1999 236-244
-
(1999)
Wear
, vol.224
, pp. 236-244
-
-
Le Bosse, J.C.1
Hansali, G.2
Lopez, J.3
Dumas, J.C.4
-
6
-
-
0020331255
-
Parameter rash-is there a cure?
-
Whitehouse D.J.Parameter rash-is there a cure? Wear 83 1982 75-78
-
(1982)
Wear
, vol.83
, pp. 75-78
-
-
Whitehouse, D.J.1
-
7
-
-
0002344794
-
Bootstrap methods: Another look at the jacknife
-
Efron B.Bootstrap methods: another look at the jacknife Ann. Stat. 7 1979 1-26
-
(1979)
Ann. Stat.
, vol.7
, pp. 1-26
-
-
Efron, B.1
-
8
-
-
84964203940
-
Bootstrap measures for standard errors, confidence intervals, and other measures of statistical accuracy
-
Efron B.Tibshirani R.Bootstrap measures for standard errors, confidence intervals, and other measures of statistical accuracy Stat. Sci. 1 1986 54-77
-
(1986)
Stat. Sci.
, vol.1
, pp. 54-77
-
-
Efron, B.1
Tibshirani, R.2
-
9
-
-
0026311694
-
Statistical data analysis in the computer age
-
Efron B.Tibshirani R.Statistical data analysis in the computer age Science 253 1991 390-395
-
(1991)
Science
, vol.253
, pp. 390-395
-
-
Efron, B.1
Tibshirani, R.2
-
11
-
-
4243920542
-
-
Ph.D. Thesis, Ecole Nationale Supérieure d'Arts et Métiers, Lille, France
-
M. Bigerelle, Caractérisation géométrique des surfaces et interfaces: applications en métallurgie, Ph.D. Thesis, Ecole Nationale Supérieure d'Arts et Métiers, Lille, France, 1999.
-
(1999)
Caractérisation Géométrique des Surfaces Et Interfaces: Applications En Métallurgie
-
-
Bigerelle, M.1
-
13
-
-
4243679610
-
Non-gaussian statistical models for scattering calculations
-
J.C. Dainty, D. Maystre (Eds.)
-
E. Jackeman, Non-gaussian statistical models for scattering calculations, in: J.C. Dainty, D. Maystre (Eds.), Waves in Random Media, vol. 1, An Institute of Physics Journal, 1991, No. 3, pp. S109-S119.
-
(1991)
Waves in Random Media, an Institute of Physics Journal
, vol.1
, Issue.3
-
-
Jackeman, E.1
-
14
-
-
0037855659
-
Fractal-surface-enhanced optical responses
-
J.L. Vehel, E. Lutton, C. Tricot (Eds.) Springer, London
-
R. Botet, E.Y. Poliakov, V.M. Shalaev, V.A. Markel, Fractal-surface-enhanced optical responses, in: J.L. Vehel, E. Lutton, C. Tricot (Eds.), Fractals in Engineering, Springer, London, 1997, pp. 237-251.
-
(1997)
Fractals in Engineering
, pp. 237-251
-
-
Botet, R.1
Poliakov, E.Y.2
Shalaev, V.M.3
Markel, V.A.4
-
15
-
-
0027639118
-
Regimes of surface roughness measurable with light scattering
-
Vorburger T.V.Marx E.Lettieri T.R.Regimes of surface roughness measurable with light scattering Wear 32 1993 3401-3408
-
(1993)
Wear
, vol.32
, pp. 3401-3408
-
-
Vorburger, T.V.1
Marx, E.2
Lettieri, T.R.3
-
16
-
-
0001480635
-
Calcul de la dimension fractale d'un profil par la méthode des autocorrélations moyennées normées (AMN)
-
Série IIb
-
M. Bigerelle, A. Iost, Calcul de la dimension fractale d'un profil par la méthode des autocorrélations moyennées normées (AMN), C.R. Acad. Sci., Série IIb 323 (1996) 669-675.
-
(1996)
C.R. Acad. Sci.
, vol.323
, pp. 669-675
-
-
Bigerelle, M.1
Iost, A.2
-
17
-
-
0035399539
-
A new method to calculate fractal dimension of a surface: Application to the human cell proliferation
-
Bigerelle M.Iost A.A new method to calculate fractal dimension of a surface: Application to the human cell proliferation Comput. Math. Appl. 42 2001 241-253
-
(2001)
Comput. Math. Appl.
, vol.42
, pp. 241-253
-
-
Bigerelle, M.1
Iost, A.2
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