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Volumn 224, Issue 2, 1999, Pages 236-244

Characterisation of surface roughness by laser light scattering: Diffusely scattered intensity measurement

Author keywords

Light scattering; Roughness parameters; Surface roughness

Indexed keywords

SURFACE ROUGHNESS;

EID: 0033075692     PISSN: 00431648     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0043-1648(98)00333-0     Document Type: Article
Times cited : (20)

References (13)
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  • 2
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    • Scattering characteristics of optical materials
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    • Bennett, H.E.1
  • 3
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    • Detrio, J.A.1
  • 5
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    • Surface roughness measurements from coherent light scattering
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    • (1976) Opt. Quant. Electr. , vol.8 , pp. 323
    • Chandley, P.J.1
  • 6
    • 0016975452 scopus 로고
    • Determination of the autocorrelation function of height on a rough surface from coherent light scattering
    • Chandley P.J. Determination of the autocorrelation function of height on a rough surface from coherent light scattering. Opt. Quant. Electr. 8:1976;329.
    • (1976) Opt. Quant. Electr. , vol.8 , pp. 329
    • Chandley, P.J.1
  • 7
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    • Direct and inverse problems for light scattered by rough surfaces
    • Marx E., Vorbuger T. Direct and inverse problems for light scattered by rough surfaces. Applied Optics. 29(25):1990;3613.
    • (1990) Applied Optics , vol.29 , Issue.25 , pp. 3613
    • Marx, E.1    Vorbuger, T.2
  • 8
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    • Determination of surface roughness from light scattering measurements
    • Heitmann D., Permien V. Determination of surface roughness from light scattering measurements. Optical Communications. 23:1977;131.
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    • Heitmann, D.1    Permien, V.2
  • 9
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    • Scattering of light by slightly rough surfaces of thin films including plasma resonance emission
    • Kroëger E., Kretschmann E. Scattering of light by slightly rough surfaces of thin films including plasma resonance emission. Z. Phys. 237:1970;173.
    • (1970) Z. Phys. , vol.237 , pp. 173
    • Kroëger, E.1    Kretschmann, E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.