Microstructure studies on hexagonal layered Ni-S nanocrystals

Applied Surface Science

Volumn 217, Issue 1-4, 2003, Pages 23-27

  Sun, Xiangcheng ^a  

^a UNIVERSITY OF ALABAMA   (United States)

Author keywords

High resolution transmission electron microscopy; Moir patterns; Ni S nanocrystals

Indexed keywords

CRYSTALLOGRAPHY; CRYSTALS; IMAGE ANALYSIS; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 0038200891     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00566-X     Document Type: Article

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