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Volumn 82, Issue 18, 2003, Pages 3023-3025
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Absence of carrier recombination associated with the defect pool model in intrinsic amorphous silicon layers: Evidence from current-voltage characteristics on p-i-n and n-i-p solar cells
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHOUS MATERIALS;
CURRENT VOLTAGE CHARACTERISTICS;
DEFECTS;
SOLAR CELLS;
DEFECT POOL MODEL;
SILICON;
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EID: 0038189733
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1571985 Document Type: Article |
Times cited : (25)
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References (14)
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