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Volumn 1, Issue , 2003, Pages

Increasing the immunity to electromagnetic interferences in a bandgap voltage reference

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); TOPOLOGY; VLSI CIRCUITS;

EID: 0038150820     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (2)

References (4)
  • 2
    • 0028377736 scopus 로고
    • Effect of conducted EMI on the DC performances of operational amplifiers
    • A. S. Poulton. Effect of conducted EMI on the DC performances of operational amplifiers. IEE Electronics Letters, vol. 30, pp. 282-284, 1994.
    • (1994) IEE Electronics Letters , vol.30 , pp. 282-284
    • Poulton, A.S.1
  • 3
    • 0038371794 scopus 로고    scopus 로고
    • Failures induced on analog integrated circuits from conveyed electromagnetic interferences: A review
    • G. Masetti et Al. Failures Induced on Analog Integrated Circuits from Conveyed Electromagnetic Interferences: a review. Microelectronics and Reliability, vol. 38, pp. 995,1996.
    • (1996) Microelectronics and Reliability , vol.38 , pp. 995
    • Masetti, G.1
  • 4
    • 0141898418 scopus 로고    scopus 로고
    • Increasing the immunity to electromagnetic interferences of CMOS OpAmps
    • A. Richelli et Al. Increasing the immunity to Electromagnetic Interferences of CMOS OpAmps, to appear on IEEE Transactions on Reliability, 2003.
    • (2003) IEEE Transactions on Reliability
    • Richelli, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.