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Volumn 26, Issue 2, 2001, Pages 102-107

Progress in the atomic-scale analysis of materials with the three-dimensional atom probe

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0038107187     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2001.296     Document Type: Article
Times cited : (14)

References (39)
  • 4
    • 36549104814 scopus 로고    scopus 로고
    • European Patent No. 0231247 (October 10, 1990)
    • A. Cerezo, T.J. Godfrey, and G.D.W. Smith, Rev. Sci. Instrum. 59 (1988) p. 862; G.D.W. Smith and A. Cerezo, European Patent No. 0231247 (October 10, 1990).
    • Smith, G.D.W.1    Cerezo, A.2
  • 30
    • 0003800798 scopus 로고    scopus 로고
    • Kluwer Academic, New York
    • M.K. Miller, A. Cerezo, M.G. Hetherington, and G.D.W. Smith, Atom Probe Field-Ion Microscopy (Oxford University Press, Oxford, 1996) p. 192-199; M.K. Miller, Atom Probe Tomography: Analysis at the Atomic Level (Kluwer Academic, New York, 2000) p. 148-152.
    • (2000) Atom Probe Tomography: Analysis at the Atomic Level , pp. 148-152
    • Miller, M.K.1
  • 39


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.