메뉴 건너뛰기




Volumn 4850, Issue 2, 2002, Pages 902-909

Monolithic Ge:Ga two-dimensional array detector for FIS instrument on ASTRO-F

Author keywords

ASTRO F; Detector; Far infrared; Ge:Ga photoconductor; Monolithic array; Satellite

Indexed keywords

ASTRONOMY; CRYOGENICS; GALLIUM; GERMANIUM; MOSFET DEVICES; PHOTOCONDUCTING MATERIALS; PHOTOMETRY; SPACE TELESCOPES;

EID: 0038075579     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.461485     Document Type: Conference Paper
Times cited : (16)

References (9)
  • 2
    • 0038413964 scopus 로고    scopus 로고
    • ASTRO-F mission
    • in this volume
    • H. Shibai, "ASTRO-F mission", Proc. SPIE, 4850, 2002, in this volume.
    • (2002) Proc. SPIE , vol.4850
    • Shibai, H.1
  • 4
    • 0011460929 scopus 로고    scopus 로고
    • Development of far-infrared Ge:Ga photoconductor having a longitudinal configuration
    • M. Fujiwara, "Development of far-infrared Ge:Ga photoconductor having a longitudinal configuration", Appl. Phys. Lett., 77, pp. 3099-3101, 2000.
    • (2000) Appl. Phys. Lett. , vol.77 , pp. 3099-3101
    • Fujiwara, M.1
  • 5
    • 0034461056 scopus 로고    scopus 로고
    • Development of far-infrared Ge:Ga photoconductor 2D array for 3 THz imaging
    • M. Fujiwara, et al., "Development of far-infrared Ge:Ga photoconductor 2D array for 3 THz imaging", Proc. SPIE 4130, pp. 842-849, 2000.
    • (2000) Proc. SPIE , vol.4130 , pp. 842-849
    • Fujiwara, M.1
  • 6
    • 0038414047 scopus 로고    scopus 로고
    • Performance of cryogenic preamplifiers for ASTRO-F far-infrared detectors
    • in this volume
    • Y. Hibi, et al., "Performance of cryogenic preamplifiers for ASTRO-F far-infrared detectors", Proc. SPIE, 4850, 2002, in this volume.
    • (2002) Proc. SPIE , vol.4850
    • Hibi, Y.1
  • 8
    • 0038448323 scopus 로고    scopus 로고
    • Origin of the hook effect in extrinsic photoconductors
    • N.M. Haegel, et al., "Origin of the hook effect in extrinsic photoconductors", Appl. Optics, 40, pp. 5748, 2001.
    • (2001) Appl. Optics , vol.40 , pp. 5748
    • Haegel, N.M.1
  • 9
    • 1642412697 scopus 로고    scopus 로고
    • Laboratory measurements of transient behavior of stressed Ge:Ga Detectors
    • in press
    • Kaneda, et al., "Laboratory Measurements of Transient Behavior of Stressed Ge:Ga Detectors", proceedings of 'The calibration legacy of the ISO Mission', 2001, in press.
    • (2001) Proceedings of 'The Calibration Legacy of the ISO Mission'
    • Kaneda1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.