Measurement of complex permittivity and permeability and thickness of multilayered medium by an open-ended waveguide method

IEEE Transactions on Instrumentation and Measurement

Volumn 46, Issue 2, 1997, Pages 519-522

  Tantot, Olivier ^b   Chatard Moulin, Michel ^b   Guillon, Pierre ^a,b  

^a IEEE

^b Institut de Recherche en Communications Optiques et Microondes (IRCOM)   (France)

Author keywords

Dielectric and magnetic characterization; Dielectric and thickness characterization; Multilayered medium; Open ended circular waveguide; Simultaneous characterization

Indexed keywords

CIRCULAR WAVEGUIDES; DIELECTRIC MATERIALS; FINITE ELEMENT METHOD; MAGNETIC LEAKAGE; MAGNETIC PERMEABILITY MEASUREMENT; WAVEGUIDES;

MULTILAYERED MEDIUM; OPEN ENDED WAVEGUIDE METHOD;

PERMITTIVITY MEASUREMENT;

EID: 0031124923     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.571900     Document Type: Article

References (5)

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3. D. Colombo, Les Transformées de Mellin et de Hankel. Paris, France: C.N.R.S., 1959.
4. D. K. Ghodgaonkar, V. V. Varadan, and V. K. Varadan, Free-space measurement of complex permittivity and complex permeability of magnetic materials at microwave frequencies, IEEE Trans. Instrum. Meas., vol. 39, pp. 387-394, Apr. 1990.
5. D. Lemaire, D. Cros, H. Jallageas, and P. Guillon, Caractérisation de matériaux de - 160°C à 800°C - Mesures de 6 GHz à 110 GHz, in Conf. Rec. J.C.M.M./96, Chambéry, France, Apr. 1996, pp. 49-52.