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Volumn 32, Issue 4, 2003, Pages 817-828
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Perturbation calculus for eikonal application to analysis of the deflectional signal in photothermal measurements
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Author keywords
[No Author keywords available]
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Indexed keywords
GRAPH THEORY;
PHOTOCURRENTS;
PHOTODIODES;
PROBES;
THERMODYNAMIC PROPERTIES;
PHOTOTHERMAL MEASUREMENTS;
GEOMETRICAL OPTICS;
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EID: 0038046695
PISSN: 00785466
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (7)
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References (10)
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