Parameters estimation in photothermal measurements with photodeflectional detection

Materials Science Forum

Volumn 210-213, Issue PART 1, 1996, Pages 295-302

  Bukowski, R ^a   Bodzenta, J ^a   Mazur, J ^a   Kleszczewski, Z ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Fitting of Parameters; Least Square Method; Photodeflectional Method; Photothermal Measurements

Indexed keywords

COMPUTER SOFTWARE; CURVE FITTING; GEOMETRICAL OPTICS; LEAST SQUARES APPROXIMATIONS; OPTICS; PARAMETER ESTIMATION; SIGNAL NOISE MEASUREMENT; SIGNAL THEORY; TEMPERATURE MEASUREMENT; THERMAL VARIABLES MEASUREMENT; THERMODYNAMIC PROPERTIES;

FITTING OF PARAMETERS; PHOTODEFLECTIONAL METHOD; PHOTOTHERMAL MEASUREMENT;

COMPUTER SIMULATION;

EID: 3843127713     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.210-213.295     Document Type: Article

References (4)

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4. J. Bodzenta, R. Bukowski, Z. Kleszczewski, J. Mazur, under preparing to publish in J. Appl. Phys.