SCOPUS 정보 검색 플랫폼

Electrochemical and Solid-State Letters

Volumn 6, Issue 5, 2003, Pages

Oblique incidence reflectivity difference as an In Situ probe of Co electrodeposition on polycrystalline Au

(3) Schwarzacher, W a Gray, J b Zhu, X D b

a UNIVERSITY OF BRISTOL (United Kingdom)

b UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COBALT; CYCLIC VOLTAMMETRY; DISSOLUTION; ELECTRIC CURRENTS; ELECTRODEPOSITION; ELLIPSOMETRY; GIANT MAGNETORESISTANCE; GOLD; LASERS; LIGHT REFLECTION; POLYCRYSTALLINE MATERIALS; SURFACES;

CYCLIC VOLTAMMOGRAM; OBLIQUE INCIDENCE REFLECTIVITY DIFFERENCE; POLYCRYSTALLINE GOLD; ULTRATHIN COBALT FILM;

ULTRATHIN FILMS;

EID: 0038035323 PISSN: 10990062 EISSN: None Source Type: Journal
DOI: 10.1149/1.1562072 Document Type: Article

Times cited : (21)

References (14)

1
- 0003708262
- R. J. Gale, Editor, p. 87, Plenum Press, New York
- D. M. Kolb, in Spectroelectrochemistry: Theory and Practice, R. J. Gale, Editor, p. 87, Plenum Press, New York (1988).
- (1988) Spectroelectrochemistry: Theory and Practice
- Kolb, D.M.¹

2
- 0037674808
- R. H. Muller, Editor; Wiley, New York
- R. H. Muller, in Advances in Electrochemistry and Electrochemical Engineering, Vol. 9, R. H. Muller, Editor, p. 167, Wiley, New York (1973).
- (1973) Advances in Electrochemistry and Electrochemical Engineering , vol.9 , pp. 167
- Muller, R.H.¹

3
- 0030192730
- A. Wong and X. D. Zhu, Appl. Phys. A: Mater. Sci. Process., 63, 1 (1996).
- (1996) Appl. Phys. A: Mater. Sci. Process. , vol.63 , pp. 1
- Wong, A.¹ Zhu, X.D.²

4
- 0001308463
- X. D. Zhu, H. B. Lu, G. Z. Yang, Z. Y. Li, B. Y. Gu, and D. Z. Zhang, Phys. Rev. B, 57, 2514 (1998).
- (1998) Phys. Rev. B , vol.57 , pp. 2514
- Zhu, X.D.¹ Lu, H.B.² Yang, G.Z.³ Li, Z.Y.⁴ Gu, B.Y.⁵ Zhang, D.Z.⁶

5
- 0032620724
- X. D. Zhu, W. Si, X. X. Xi, Q. Li, and M. G. Medici, Appl. Phys. Lett., 74, 3540 (1999).
- (1999) Appl. Phys. Lett. , vol.74 , pp. 3540
- Zhu, X.D.¹ Si, W.² Xi, X.X.³ Li, Q.⁴ Medici, M.G.⁵

6
- 0008355738
- X. D. Zhu, W. Si, X. X. Xi, and Q. D. Jiang, Appl. Phys. Lett., 78, 460 (2001).
- (2001) Appl. Phys. Lett. , vol.78 , pp. 460
- Zhu, X.D.¹ Si, W.² Xi, X.X.³ Jiang, Q.D.⁴

7
- 79956018720
- F. Chen, T. Zhao, Y. Y. Fei, H. B. Lu, Z. H. Chen, G. Z. Yang, and X. D. Zhu, Appl. Phys. Lett. 80, 2889 (2002).
- (2002) Appl. Phys. Lett. , vol.80 , pp. 2889
- Chen, F.¹ Zhao, T.² Fei, Y.Y.³ Lu, H.B.⁴ Chen, Z.H.⁵ Yang, G.Z.⁶ Zhu, X.D.⁷

8
- 0030193918
- W. Schwarzacher and D. S. Lashmore, IEEE Trans. Magn., 32, 3133 (1996).
- (1996) IEEE Trans. Magn. , vol.32 , pp. 3133
- Schwarzacher, W.¹ Lashmore, D.S.²

9
- 0001241411
- J. L. Budendorff, E. Beaurepaire, C. Mény, P. Panissod, and J. P. Bucher, Phys. Rev. B, 56, R7120 (1997).
- (1997) Phys. Rev. B , vol.56
- Budendorff, J.L.¹ Beaurepaire, E.² Mény, C.³ Panissod, P.⁴ Bucher, J.P.⁵

10
- 0034907472
- L. Cagnon, T. Devolder, R. Cortes, A. Morrone, J. E. Schmidt, C. Chappert, and P. Allongue, Phys. Rev. B, 63, 104419 (2001)
- (2001) Phys. Rev. B , vol.63 , pp. 104419
- Cagnon, L.¹ Devolder, T.² Cortes, R.³ Morrone, A.⁴ Schmidt, J.E.⁵ Chappert, C.⁶ Allongue, P.⁷

11
- 0034276014
- L. Cagnon, A. Gündel, T. Devolder, A. Morrone, C. Chappert, J. E. Schmidt, and P. Allongue, Appl. Surf. Sci., 164, 22 (2000).
- (2000) Appl. Surf. Sci. , vol.164 , pp. 22
- Cagnon, L.¹ Gündel, A.² Devolder, T.³ Morrone, A.⁴ Chappert, C.⁵ Schmidt, J.E.⁶ Allongue, P.⁷

12
- 0038350818
- M. Stedman, Chem. Phys. Lett., 2, 457 (1968).
- (1968) Chem. Phys. Lett. , vol.2 , pp. 457
- Stedman, M.¹

13
- 0037674809
- Fachinformationszentrum, Karlsruhe
- J. H. Weaver and D. W. Lynch, Optical Properties of Metals 18, no. 2, Fachinformationszentrum, Karlsruhe (1981).
- (1981) Optical Properties of Metals 18 , Issue.2
- Weaver, J.H.¹ Lynch, D.W.²

14
- 0038689202
- A. Gündel, E. Chassaing, and J. E. Schmidt, J. Appl. Phys., 90, 5257 (2001).
- (2001) J. Appl. Phys. , vol.90 , pp. 5257
- Gündel, A.¹ Chassaing, E.² Schmidt, J.E.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.