X-ray microscopy by phase-retrieval methods at the advanced light source

Journal De Physique. IV : JP

Volumn 104, Issue , 2003, Pages 557-561

  Howells, M R ^a   Chapman, H ^b   Hau Riege, S ^b   He, H ^a   Marchesini, S ^a   Spence, J ^a,c   Weierstall, U ^c  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

^c ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ELECTRON OPTICS; FOURIER TRANSFORMS; IMAGE RECONSTRUCTION; ITERATIVE METHODS; MONOCHROMATORS; X RAY DIFFRACTION; X RAY MICROSCOPES;

NYQUIST DENSITY; PHASE RETRIEVAL METHODS; VISIBLE LIGHT OPTICS;

SCANNING ELECTRON MICROSCOPY;

EID: 0038025665     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20030143     Document Type: Conference Paper

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