Determination of interfacial tensions for Xe nanoprecipitates in Al at 300 K

Philosophical Magazine Letters

Volumn 83, Issue 1, 2003, Pages 57-64

  Allen, C W ^a   Birtcher, R C ^a   Donnelly, S E ^b   Song, M ^c   Mitsuishi, K ^c   Furura, K ^c   Dahmen, U ^d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b UNIVERSITY OF SALFORD   (United Kingdom)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; ANISOTROPY; NANOSTRUCTURED MATERIALS; PRECIPITATION (CHEMICAL); SURFACE TENSION;

LAPLACE PRESSURE;

XENON;

EID: 0038017772     PISSN: 09500839     EISSN: None     Source Type: Journal    
DOI: 10.1080/0950083021000045733     Document Type: Article

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