Resolution, stability and efficiency of resistivity tomography estimated from a generalized inverse approach

Geophysical Journal International

Volumn 153, Issue 2, 2003, Pages 305-316

  Friedel, Sven ^a,b  

^a ETH ZURICH   (Switzerland)

^b UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

Electrical resistivity tomography; Inverse modelling; Resolution; Stability

Indexed keywords

ELECTRICAL RESISTIVITY; IMAGING METHOD; INVERSE ANALYSIS; RESOLUTION; TOMOGRAPHY;

EID: 0038015964     PISSN: 0956540X     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-246X.2003.01890.x     Document Type: Article

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