3D large deformation and nonlinear stress analyses of tin whisker initiation and growth on lead-free components

Proceedings - Electronic Components and Technology Conference

Volumn , Issue , 2003, Pages 692-697

  Lau, John H ^a   Pan, Stephen H ^b   Xu, Chen ^c  

^a AGILENT TECHNOLOGIES   (United States)

^b Optimal Corporation   (United States)

^c Enthone Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPRESSIVE STRESS; CRYSTAL GROWTH; CRYSTAL WHISKERS; DEFORMATION; DIFFUSION; ELASTOPLASTICITY; LEAD; RELIABILITY; STRESS ANALYSIS;

LEAD FREE COMPONENTS; NONLINEAR STRESS ANALYSIS; TIN WHISKER INITIATION;

TIN;

EID: 0038012664     PISSN: 05695503     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

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