Surface analysis of softened paper by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and the Kawabata evaluation system

Journal of Materials Science

Volumn 38, Issue 10, 2003, Pages 2171-2177

  Parfitt, M ^a   Vickerman, J C ^a   Mitchell, R ^b   Carr, C M ^a   Ince, N ^c   Knight, P ^c  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b CSMA Ltd   (United Kingdom)

^c Hercules Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FRICTION; PAPER; SECONDARY ION MASS SPECTROMETRY; SURFACE PROPERTIES;

SURFACE ANALYSIS;

MATERIALS SCIENCE;

EID: 0038006706     PISSN: 00222461     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1023728114543     Document Type: Conference Paper

References (13)

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