Growth and characterization of sputtered epitaxial γ′Fe4N and NbN films and bilayers using electron backscatter diffraction patterns and magnetometry

Applied Physics Letters

Volumn 82, Issue 19, 2003, Pages 3281-3283

  Loloee, R ^a   Nikolaev, K R ^a,b   Pratt Jr , W P ^a  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b SEAGATE TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BACKSCATTERING; CRYSTAL ORIENTATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; MAGNESIA; MAGNETIC ANISOTROPY; MAGNETIC FILMS; MAGNETOMETERS; SINGLE CRYSTALS; SPUTTER DEPOSITION; SQUIDS;

ELECTRON BACKSCATTER DIFFRACTION (EBSD);

FILM GROWTH;

EID: 0037981262     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1573356     Document Type: Article

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