Analysis of terrace size fluctuations of B-induced stripe structures on the Si (001) surface

Applied Physics Letters

Volumn 73, Issue 5, 1998, Pages 605-607

  Fujita, Ken ^a   Ichikawa, Masakazu ^a  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037966720     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.121870     Document Type: Article

References (13)

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