An improved goniometer head for high-temperature single-crystal X-ray diffraction

Journal of Applied Crystallography

Volumn 32, Issue 4, 1999, Pages 824-826

  Delarue, Patrice ^a   Jannin, Michel ^b  

^a Nancy University CNRS   (France)

^b UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037938237     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889899004471     Document Type: Article

References (6)

1. Argoud, R. & Capponi, J. J. (1984). J. Appl. Cryst. 17, 420-425.
2. Blessing, R. H. (1987). Crystallogr. Rev. 1, 3-58.
3. Delarue, P., Lecomte, C., Jannin, M., Marnier, G. & Meneart, B. (1998). Phys. Rev. B, 58, 5287-5295.
4. McCandlish, L. E., Stout, G. H. & Andrews, L. C. (1975). Acta Cryst. A31, 245-249.
5. Marnier, G., Boulanger, B., Menaert, B. & Metzger, M. (1987). French Patent No. 87/00811 (CNRS).
6. Schreuer, J., Baumgarte, A. & Steurer, W. (1997). J. Appl. Cryst. 30, 1162-1164.