A new single-crystal mounting technique for low-background high-temperature X-ray diffraction

Journal of Applied Crystallography

Volumn 30, Issue 6, 1997, Pages 1162-1164

  Schreuer, J ^a   Baumgarte, A ^a   Steurer, W ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0007206214     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897003142     Document Type: Article

References (6)

1. Baumgarte, A., Schreuer, J., Estermann, M. A. & Steurer, W. (1997). Philos. Mag. A, 75, 1665-1675.
2. Czank, M. & Kleber, E. (1971). Z. Kristallogr. 133, 168-178.
3. Estermann, M. A. & Steurer, W. (1997). Phase Transit. In the press.
4. Peterson, R. C. (1992). J. Appl. Cryst. 25, 545-548.
5. Schreuer, J., Baumgarte, A., Estermann, M. A., Steurer, W. & Reifler, H. (1996). J. Appl. Cryst. 29, 365-370.
6. Tsukimura, K., Sato-Sorensen, Y. & Ghose, S. (1989). J. Appl. Cryst. 22, 401-405.