Evaluation of guarded high-resistance hamon transfer standards

IEEE Transactions on Instrumentation and Measurement

Volumn 48, Issue 2, 1999, Pages 324-328

  Jarrett, Dean G ^a,b  

^a IEEE   (United States)

^b NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

Bridge circuits; Insulation; Measurement standards; Resistance measurement; Resistors; Transfer standards

Indexed keywords

EID: 0001754460     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.769593     Document Type: Article

References (4)

1. B.V. Hamon, "A 1-100 Ω build-up resistor for calibration of standard resistors," J. Sci. Instrum., vol. 31, pp. 450-453, Dec. 1954.
2. R.F. Dziuba, p. A. Boynton, R. E. Elmquist, D. G. Jarrett, T. P. Moore, and J. D. Neal, "NIST measurement services for dc standard resistors," Nat. Inst. Stand. Technol. Tech. Note 1298, pp. 30-44, 1992.
3. D.G. Jarrett, "Automated guarded bridge for calibration of multimegohm standard resistors from 10 MΩ to 1 TΩ," IEEE Trans. Instrum. Meas., vol. 46, no. 2, pp. 325-328, Apr. 1997.
4. R.F. Dziuba, D. G. Jarrett, L. L. Scott, and A. J. Secula, "Fabrication of high-value standard resistors," in CPEM'98 Conf. Dig., Washington, DC, July 1998, pp. 309-310.