The physical meanings of 5 basic parameters for an X-ray diffraction peak and their application

Chinese Journal of Geochemistry

Volumn 22, Issue 1, 2003, Pages 38-44

  Zhou, Jian ^a   Wang, Hejing ^b  

^a INSTITUTE OF MINERAL RESOURCES   (China)

^b PEKING UNIVERSITY   (China)

Author keywords

Application; Peak parameter; Physical meaning; X ray diffraction

Indexed keywords

LATTICE CONSTANTS; STRAIN;

GEOMETRIC CHARACTERISTICS;

X RAY DIFFRACTION;

X-RAY DIFFRACTION;

EID: 0037871475     PISSN: 10009426     EISSN: None     Source Type: Journal    
DOI: 10.1007/bf02831544     Document Type: Article

References (26)

1. Balzar, D. and H. Ledbetter, 1993, Voigt-function modeling in Fourier analysis of size- and strain-broadened X-ray diffraction peaks [J]: Journal of Applied Crystallography, v. 26, p. 97-103.
2. Bragg, R. H. and J. B. Aladekomo, 1995, Diffraction by diffusely scattering materials of high transparency [J]: Journal of Applied Crystallography, v. 28, p. 14-19.
3. De Keijser Th. H., J. I. Langford, E. J. Mittemeijer, and A. B. P. Vogels, 1982, Use of the Voigt function in a single-line method for the analysis of X-ray diffraction line broadening [J]: Journal of Applied Crystallography, v. 15, p. 308-314.
4. Frey, M. and R. F. Mahlmann, 1999, Alpine metamorphism of the central Alps: ScHWeizerische Mineralogische und Petrographische Mitteilungen [J]: v. 79, p. 135-154.
5. Hindeleh, A. M. and D. J. Johnson, 1978, Crystallinity and crystallite size measurement in polyamide and polyester fibres [J]: Polymer, v. 19, p. 27-32.
6. Ida T., M. Ando, and H. Toraya, 2000, Extended pseudo-Voigt function for approximating the Voigt profile [J]: Journal of Applied Crystallography, v. 33, p. 1311-1316.
7. Jenkins, R. and M. Nichols, 1990, Problems in the derivation of d-values from experimental digital XRD patterns [J]: Advances in X-Ray Analysis, v. 33, p. 285-293.
8. Jones, R. C., 1981, X-ray diffraction line profile analysis vs. phosphorus sorption by 11 Puerto Rican soils [J]: Soil Sci. Soc. Am. J., v. 45, p. 818-825.
9. Klug, H. P. and L. E. Alexander, 1974, X-ray diffraction procedures for polycrystalline and amorphous materials [M]: New York, John Wiley & Sons, p. 419-708.
10. Langford, J. I., D. Louër, E. J. Sonneveld, and J. W. Visser, 1986, Applications of total pattern fitting to a study of crystallite size and strain in zinc oxide powder [J]: Powder Diffraction, v. 1, p. 211-221.
11. Lanson, B. and D. Champion, 1991, The I/S-to-illite reaction in the late stage diagenesis [J]: American Journal of Science, v. 291, p. 473-506.
12. Masson, O., R. Guinebretiere, and A. Dauger, 2001, Modelling of line profile asymmetry caused by axial divergence in powder diffraction [J]: Journal of Applied Crystallography, v. 34, p. 436-441.
13. Moore, D. M. and R. C. Jr., Reynolds, 1989, X-ray diffraction and identification and analysis of clay minerals [M]: London, Oxford University Press, p. 57-101.
14. Nandi, R. K. and S. P. Sen Gupta, 1978, The analysis of X-ray diffraction profile from imperfect solids by an application of convolution relations [J]: Journal of Applied Crystallography, v. 11, p. 6-9.
15. Pfiffner, O. A., 1981, Fold-and-thrust tectonics in the Helvetic Nappes (E Switzerland), in K. R. McClay and N. J. Price, eds., Thrust and nappes tectonics [M]: Spec. Publ. Geol. Soc. London, 9. Blackwell Scientific Publication, Oxford, p. 319-327.
16. Scherrer, P., 1981, Bestimmung der Grösse und der inneren Struktur von Kolloidteilchen mittels Röntgenstrahlen, Göttinger [J]: Nachr. Math. Phys., v. 2, p. 98-100.
17. Schoening, F. R. L., 1965, Strain and particle size values from X-ray line breadths [J]: Acta Crystallographica, v. 18, p. 975-976.
18. Stern, W. B., J. Mullis, M. Rahn, and M. Frey, 1991, Deconvolution of the first "illite" basal reflection [J]: ScHWeizerische Mineralogische und Petrographische Mitteilungen, v. 71, p. 453-462.
19. Wang H. and Zhou J., 2000a, Data smoothing and distortion of X-ray diffraction peak, I. Theory [J]: Journal of Applied Crystallography, v. 33 p. 1128-1135.
20. Wang H. and Zhou J., 2000b, Data smoothing and distortion of X-ray diffraction peak, II. Application [J]: Journal of Applied Crystallography, v. 33, p. 1136-1142.
21. Wang H. and Zhou J., 2000c, The relationships between the Kübler index, Weaver index and Weber index of illite crystallinity and their applications [J]: ScHWeizerische Mineralogische und Petrographische Mitteilungen, v. 80, p. 187-198.
22. Wang, H., 1994, Step size, scanning speed and shape of XRD peak [J]: Journal of Applied Crystallography, v. 27, p. 716-721.
23. Wang H., M. Frey, and W. B. Stern, 1996, Diagenesis and metamorphism of clay minerals in the Helvetic Alps of Eastern Switzerland [J]: Clays and Clay Minerals, v. 44, p. 96-112.
24. Wang Hejing and Zhou Jian, 1998, On the indices of illite crystallinity [J]: Acta Petrologica Sinica, v. 14, n. 3, p. 395-405 (in Chinese with English abstract).
25. Wilson, A. J. C., 1963, X-ray optics [M]: London, Methuen & Co. Ltd., p. 37-54.
26. Zhu Mingxing and Wang Hejing, 2001, Very low-grade metamorphism of the Lengjiaxi and Banxi groups around the area of Changsha-Liling-Liuyang, Hunan Province, China [J]: Acta Petrologica Sinica, v. 17, n. 2, p. 291-300 (in Chinese with English abstract).