Data smoothing and distortion of X-ray diffraction peaks. II. Application

Journal of Applied Crystallography

Volumn 33, Issue 4, 2000, Pages 1136-1142

  Wang, Hejing ^a   Zhou, Jian ^b  

^a PEKING UNIVERSITY   (China)

^b Chinese Academy of Geosciences   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTIC METHOD; ARTICLE; DATA ANALYSIS; FILTER; MATHEMATICAL ANALYSIS; SIGNAL NOISE RATIO; STATISTICAL ANALYSIS; X RAY DIFFRACTION;

EID: 0034474926     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889800006944     Document Type: Article

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