The application of electrical impedance tomography to reduce systematic errors in the EEG inverse problem - A simulation study

Physiological Measurement

Volumn 21, Issue 3, 2000, Pages 379-393

  Goncalves S ^a,b   De Munck, J C ^a,c   Heethaar, R M ^c   Lopes Da Silva, F H ^d   Van Dijk, B W ^a  

^a VU UNIVERSITY MEDICAL CENTER   (Netherlands)

^b UNIVERSITY OF LISBON   (Portugal)

^c VU UNIVERSITY MEDICAL CENTER   (Netherlands)

^d Institute for Neurobiology   (Netherlands)

Author keywords

3 layer sphere head model; Dipole position error; Dipole strength error; EEG inverse problem; Electrical conductivities; Electrical impedance tomography; Systematic errors

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRODES; ELECTROENCEPHALOGRAPHY; ELECTROPHYSIOLOGY; INVERSE PROBLEMS; SIGNAL TO NOISE RATIO; SYSTEMATIC ERRORS;

3-LAYER SPHERE HEAD MODEL; DIPOLE POSITION ERROR; DIPOLE STRENGTH ERROR; DIPOLE STRENGTHS; ELECTRICAL CONDUCTIVITY; ELECTRICAL IMPE DANCE TOMOGRAPHY (EIT); ELECTROENCEPHALOGRAPHY INVERSE PROBLEM; HEAD MODEL; POSITION ERRORS; SIMULATION STUDIES;

ELECTRIC IMPEDANCE;

ANALYTICAL ERROR; ARTICLE; BRAIN TOMOGRAPHY; COMPUTER ASSISTED IMPEDANCE TOMOGRAPHY; DIPOLE; ELECTRIC CONDUCTIVITY; ELECTRIC POTENTIAL; ELECTROENCEPHALOGRAPHY; MATHEMATICAL MODEL; PRIORITY JOURNAL; SIGNAL NOISE RATIO; SIMULATION;

EID: 0033855918     PISSN: 09673334     EISSN: None     Source Type: Journal    
DOI: 10.1088/0967-3334/21/3/304     Document Type: Article

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