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Volumn 532-535, Issue , 2003, Pages 628-632
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High-resolution Si2p core-level and low-energy electron diffraction studies of the Ca/Si(1 1 1)-(3 × 2) surface
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Author keywords
Low energy electron diffraction (LEED); Photoelectron spectroscopy; Semiconducting surfaces; Silicon; Surface structure, morphology, roughness, and topography
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Indexed keywords
CALCIUM;
COOLING;
LOW ENERGY ELECTRON DIFFRACTION;
MORPHOLOGY;
PHOTOELECTRON SPECTROSCOPY;
SEMICONDUCTING SILICON;
SURFACE ROUGHNESS;
SEMICONDUCTING SURFACES;
SURFACE STRUCTURE;
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EID: 0037846128
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/S0039-6028(03)00188-2 Document Type: Conference Paper |
Times cited : (6)
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References (22)
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