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Volumn 532-535, Issue , 2003, Pages 628-632

High-resolution Si2p core-level and low-energy electron diffraction studies of the Ca/Si(1 1 1)-(3 × 2) surface

Author keywords

Low energy electron diffraction (LEED); Photoelectron spectroscopy; Semiconducting surfaces; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

CALCIUM; COOLING; LOW ENERGY ELECTRON DIFFRACTION; MORPHOLOGY; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING SILICON; SURFACE ROUGHNESS;

EID: 0037846128     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00188-2     Document Type: Conference Paper
Times cited : (6)

References (22)
  • 4
    • 4244076847 scopus 로고
    • Wan K.J., Lin X.F., Nogami J. Phys. Rev. B. 46:1992;13635. 47 (1993) 13700.
    • (1993) Phys. Rev. B , vol.47 , pp. 13700


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.