Epitaxial ZnS thin films grown by single source chemical vapor deposition

Journal of Physical Chemistry B

Volumn 104, Issue 6, 2000, Pages 1150-1152

  Tran, Nguyen H ^a   Hartmann, Andreas J ^a   Lamb, Robert N ^a  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL VAPOR DEPOSITION; CRYSTAL ORIENTATION; EPITAXIAL GROWTH; FILM GROWTH; ORGANOMETALLICS; SEMICONDUCTING SILICON; SEMICONDUCTING ZINC COMPOUNDS; SEMICONDUCTOR GROWTH; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

SINGLE SOURCE CHEMICAL VAPOR DEPOSITION (SS CVD); X RAY PHOTOELECTRON DIFFRACTION (XPD);

SEMICONDUCTING FILMS;

EID: 0033904586     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp993758h     Document Type: Article

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