Sine-wave parameters estimation - The second source of inaccuracy

Conference Record - IEEE Instrumentation and Measurement Technology Conference

Volumn 2, Issue , 2003, Pages 1328-1333

  Hejn, Konrad ^a   Pacut, Andrzej ^a  

^a WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; ITERATIVE METHODS; PARAMETER ESTIMATION; SIGNAL ENCODING; ANALOG TO DIGITAL CONVERSION; ELECTRIC SIGNAL SYSTEMS; FILLING; FREQUENCY ESTIMATION; INTEGRATED CIRCUITS; MIXED SIGNAL INTEGRATED CIRCUITS; STANDARDS; TESTING;

DIFFERENTIAL NON-LINEARITY;

ANALOG TO DIGITAL CONVERSION; PARAMETER ESTIMATION;

AMPLITUDE ESTIMATION; CIRCUIT TESTING; EQUATIONS; FREQUENCY; ITERATIVE ALGORITHM; SAMPLING METHOD; SIGNAL RESOLUTION;

EID: 0037821601     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (13)

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2. IEEE Std 1241-2000, "IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters," 2000.
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13. M. Mahoney, DSP-Based Testing of Analog and Mixed-Signal Circuits, chapter 2 and 4, The Computer Society of the IEEE, 1987.