The effective resolution measurements in scope of sine-fit test

IEEE Transactions on Instrumentation and Measurement

Volumn 47, Issue 1, 1998, Pages 45-50

  Hejn, Konrad ^b   Pacut, Andrzej ^a,b   Kramarski, Leszek ^b  

^a IEEE   (Poland)

^b WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

Analog digital conversion; Circuit simulation; Effective resolution; Error analysis; IEEE standards; Quantization; Sine fit test

Indexed keywords

ANALOG TO DIGITAL CONVERSION; ELECTRIC TRANSFORMER TESTING; MEASUREMENT ERRORS; MEASUREMENTS;

SINE-FIT TEST; STANDARD DEVIATION;

ELECTRONIC EQUIPMENT TESTING;

EID: 0031988362     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.728787     Document Type: Article

References (10)

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