Investigation on process dependence of self-assembled metal nanocrystals

Materials Research Society Symposium - Proceedings

Volumn 737, Issue , 2003, Pages 691-696

  Lee, Chungho ^a   Liu, Zengtao ^a   Kan, Edwin C ^a  

^a Cornell University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DATA STORAGE EQUIPMENT; ELECTRIC VARIABLES MEASUREMENT; METALS; PARTICLE SIZE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SELF ASSEMBLY; SEMICONDUCTOR DOPING; TEMPERATURE; THICKNESS MEASUREMENT; TRANSMISSION ELECTRON MICROSCOPY; ULTRATHIN FILMS;

CAPACITANCE-VOLTAGE MEASUREMENT; ELECTRICAL EVALUATION; FOWLER-NORDHEIM TUNNELING; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SCHOTTKY CHARGE EFFECTS; SELF-ASSEMBLED METAL NANOCRYSTALS;

NANOSTRUCTURED MATERIALS;

EID: 0037811539     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

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