Spectroellipsometric studies of 0.9PbMg1/3Nb2/3O3-0.1PbTiO3 thin films

Journal of Materials Science: Materials in Electronics

Volumn 14, Issue 5-7, 2003, Pages 345-348

  Tsang, W S ^a   Hau, F F ^a   Mak, C L ^a   Wong, K H ^a  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; ELLIPSOMETRY; LANTHANUM COMPOUNDS; MORPHOLOGY; PERMITTIVITY; PEROVSKITE; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPIC ANALYSIS; THICKNESS MEASUREMENT; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

LEAD MAGNESIUM NIOBATE; LEAD TITANATE; SPECTROELLIPSOMETRY;

LEAD COMPOUNDS;

EID: 0037811390     PISSN: 09574522     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1023988315555     Document Type: Article

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