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Volumn , Issue 149 PART II, 1998, Pages 1127-1132

Thermal stress analysis of a PQFP moulding process: Comparison of viscoelastic and elastic models

Author keywords

Failure Mechanisms; Finite Element Analysis; PQFP; Residual Thermal Stresses; Viscoelastic Moulding Compound

Indexed keywords


EID: 0037802677     PISSN: 10139826     EISSN: 16629795     Source Type: Book Series    
DOI: None     Document Type: Review
Times cited : (19)

References (13)
  • 1
    • 0027813193 scopus 로고
    • Reliability of Postmolded IC Packages
    • Nguyen, "Reliability of Postmolded IC Packages," Journal of Electronic Packaging, Vol.115, (1993) pp.346-355.
    • (1993) Journal of Electronic Packaging , vol.115 , pp. 346-355
    • Nguyen1
  • 3
    • 0023984412 scopus 로고
    • An Approximate Analysis of Stresses in Multilayered Elastic Thin Film
    • E. Suhir, "An Approximate Analysis of Stresses in Multilayered Elastic Thin Film," Journal of Applied Mechanics, Vol.55, (1988) pp.143-148.
    • (1988) Journal of Applied Mechanics , vol.55 , pp. 143-148
    • Suhir, E.1
  • 4
    • 84964624288 scopus 로고
    • Predicted Bow of Plastic Packages Due to the Nonuniform Through-Thickness Distribution of Temperature
    • E. Suhir and L.T. Manzione, "Predicted Bow of Plastic Packages Due to the Nonuniform Through-Thickness Distribution of Temperature," Journal of Electronic Packaging, Vol.114, (1992) pp.329-335.
    • (1992) Journal of Electronic Packaging , vol.114 , pp. 329-335
    • Suhir, E.1    Manzione, L.T.2
  • 5
    • 0026676124 scopus 로고
    • Investigation of Thermo-Mechanically Induced Stress in a PQFP 160 Using Finite Element Techniques
    • G. Kelly, C. Lyden, C. O' Mathuna and J.S. Campbell, "Investigation of Thermo-Mechanically Induced Stress in a PQFP 160 Using Finite Element Techniques," 42nd Electronic Component Conference, (1992) pp.467-472.
    • (1992) 42nd Electronic Component Conference , pp. 467-472
    • Kelly, G.1    Lyden, C.2    O'Mathuna, C.3    Campbell, J.S.4
  • 8
    • 0027553244 scopus 로고
    • Thermal Stress Measurement in Silicon Chips Encapsulated in IC Plastic Packages under Temperature Cycling
    • H. Miura, M. Kitano, A. Nishimura, and S. Kawai, "Thermal Stress Measurement in Silicon Chips Encapsulated in IC Plastic Packages Under Temperature Cycling," Journal of Electronic Packaging, Vol.115, (1993) pp.9-15.
    • (1993) Journal of Electronic Packaging , vol.115 , pp. 9-15
    • Miura, H.1    Kitano, M.2    Nishimura, A.3    Kawai, S.4
  • 9
    • 0026850859 scopus 로고
    • Viscoelastic Properties of Resin for IC Plastic Packages and Residual Stress
    • H. Kawada and K. Ikegami, "Viscoelastic Properties of Resin for IC Plastic Packages and Residual Stress," JSME International Journal, Series I, Vol.35, No.2, (1992) pp.152-158.
    • (1992) JSME International Journal, Series I , vol.35 , Issue.2 , pp. 152-158
    • Kawada, H.1    Ikegami, K.2
  • 12
    • 20444399818 scopus 로고    scopus 로고
    • Master of Philosophy Thesis, Department of Electrical and Electronic Engineering, Hong Kong University of Science and Technology, Hong Kong
    • C.P. Lo, "Design, Fabrication and Characterisation of Micro-strain Gauges for VLSI Packaging Application," Master of Philosophy Thesis, Department of Electrical and Electronic Engineering, Hong Kong University of Science and Technology, Hong Kong (1996)
    • (1996) Design, Fabrication and Characterisation of Micro-strain Gauges for VLSI Packaging Application
    • Lo, C.P.1
  • 13
    • 0022313453 scopus 로고    scopus 로고
    • Stress deformation of aluminum metallization in plastic molded semiconductor devices
    • R.E. Thomas, "Stress deformation of aluminum metallization in plastic molded semiconductor devices," IEEE Trans. Components, Hybrids and Manufacturing Technology, Vol.8, pp. 427-434
    • IEEE Trans. Components, Hybrids and Manufacturing Technology , vol.8 , pp. 427-434
    • Thomas, R.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.