Infrared reflectance spectra of semi-transparent SiO2 rich films on silicate glasses: Influence of the substrate and film thickness

Journal of Non-Crystalline Solids

Volumn 321, Issue 1-2, 2003, Pages 110-119

  Geotti Bianchini, Franco ^a   Preo, Martina ^a   Guglielmi, Massimo ^b   Pantano, Carlo G ^c  

^a STAZIONE SPERIMENTALE DEL VETRO   (Italy)

^b UNIVERSITY OF PADOVA   (Italy)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COATING TECHNIQUES; COMPUTER SIMULATION; INFRARED SPECTROSCOPY; SILICA; SILICATES; SOL-GELS; SUBSTRATES; SURFACE PHENOMENA;

FILM THICKNESS;

GLASS;

EID: 0037799385     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3093(03)00154-6     Document Type: Article

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