Poly(methyl methacrylate) films for organic vapour sensing

Journal of Physics D: Applied Physics

Volumn 36, Issue 9, 2003, Pages 1115-1119

  Capan, R ^a   Ray, A K ^b   Hassan, A K ^b   Tanrisever, T ^a  

^a BALIKESIR UNIVERSITY   (Turkey)

^b SHEFFIELD HALLAM UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

BENZENE; ELLIPSOMETRY; HYDRODYNAMICS; POLYMETHYL METHACRYLATES; REFRACTIVE INDEX; THICKNESS MEASUREMENT; TOLUENE; VAPORS; VISCOSITY OF LIQUIDS; XYLENE;

ETHYL BENZENE; FILM THICKNESS; HIGHLY VOLATILE LIQUID; LOW-VISCOSITY LIQUID; ORGANIC VAPOR SENSING; POLYMETHYL METHACRYLATE FILM;

PLASTIC FILMS;

EID: 0037799322     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/36/9/309     Document Type: Article

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