Image correction in magneto-optical microscopy

Review of Scientific Instruments

Volumn 74, Issue 6, 2003, Pages 2999-3001

  Paturi, P ^a,b   Hvolbaek Larsen B ^b,c   Jacobsen, B A ^b   Andersen, N H ^b  

^a UNIVERSITY OF TURKU   (Finland)

^b TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^c NKT Research & Innovation AS   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; LIGHT POLARIZATION; LIGHT REFLECTION; MAGNETIC FIELD EFFECTS; SUPERCONDUCTING MATERIALS;

IMAGE CORRECTION;

MAGNETOOPTICAL EFFECTS;

EID: 0037773125     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1571952     Document Type: Article

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15. This can be understood from Eqs. (4) and (5) as (SIGNAL-BIAS)/(1/AVE)(BACKGROUND-BIAS) = AVE if SIGNAL = BACKGROUND.