Birefringence in rapidly rotating glass disks

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 15, Issue 5, 1998, Pages 1202-1211

  de Groot, Peter ^a  

^a ZYGO CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037757569     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.15.001202     Document Type: Article

References (24)

1. C. Lin, “Techniques for the measurement of air-bearing separation-a review, ” IEEE Trans. Magn. MAG-9, 673–677 (1973).
2. J. M. Fleischer and C. Lin, “Infrared laser interferometer for measuring air-bearing separation, ” IBM J. Res. Develop. 18, 529–533 (1974).
3. T. Ohkubo and J. Kishegami, “Accurate measurement of gas-lubricated slider bearing separation using laser inter-ferometry, ” Trans. Am. Soc. Mech. Eng., 110, 148–155 (1988).
4. C. Lacey, J. A. Adams, E. W. Ross, and A. Cormier, “A new method for measuring flying height dynamically, ” in Proceedings of DiskCon ‘92 (International Disk Drive Equipment and Materials Association, San Jose, Calif., 1992), pp. 27–42.
5. G. Sommargren, “Flying height and topography measuring interferometer, ” U.S. patent 5, 218, 424 (June 8, 1993).
6. P. de Groot, L. Deck, J. Soobitsky, and J. Biegen, “Polarization interferometer for measuring the flying height of magnetic read-write heads, ” Opt. Lett. 21, 441–443 (1996).
7. C. Lacey and C. Duran, IDEMA Insight, 9(6), 1 (1996).
8. P. de Groot, “Optical gap measuring apparatus and method" U.S. patent 5, 557, 399 (September 17, 1996).
9. P. de Groot, L. Deck, J. Soobitsky, and J. Biegen, “Optical flying-height testing of magnetic read-write heads, ” in Lasers, Optics, and Vision for Productivity in Manufacturing I, C. Gorecky, ed., Proc. SPIE 2782, 47–57 (1996).
10. P. de Groot, J. Biegen, L. Deck, A. Dergevorkian, T. Erickson, J. Morace, R. Pavlat, and J. Soobitsky, “Polarization interferometer for flying height testing" in Proceedings of the Future Dimensions in Storage Symposium (International Disk Drive Equipment and Materials Association San Diego, Calif., 1997), pp. 89–94.
11. W. Siebourg, H. Schmid, F. M. Rateike, S. Anders, U. Grigg, and H. Lower, “Birefringence-an important property of plastic substrates for magneto-optical storage disks, ” Polym. Eng. Sci. 30, 1133–1139 (1990).
12. W. A. Challener and T. A. Rinehart, “Jones matrix analysis of magnetooptical media and read-back systems, ” Appl. Opt. 26, 3974–3980 (1987).
13. A. Takahashi, M. Mieda, Y. Murakami, K. Ohta, and H. Yamaoka, “Influence of birefringence on the signal quality of magnetooptic disks using polycarbonate substrates, ” Appl. Opt. 27, 2863–2866 (1988).
14. M. Horie, “Simple birefringence measurement method for coated optical disks with a fixed incident angle ellipsometer, ” Appl. Opt. 34, 5715–5719 (1995).
15. H. Fu, S. Sugaya, J. K. Erwin, and M. Mansuripur, “Measurement of birefringence for optical recording of disk substrates, ” Appl. Opt. 33, 1938–1949 (1994).
16. W. C. Young, Roark’s Formulas for Stress and Strain, 6th ed. (McGraw-Hill, New York, 1989), p. 704.
17. For an analysis based on the index ellipsoid, see, for example, M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, New York, 1980), p. 674.
18. E. A. Saleh and M. C. Teich, Fundamentals of Photonics (Wiley, New York, 1991), p. 217.
19. G. Fowles, Introduction to Modern Optics, 2nd ed. (Dover, New York, 1975), pp. 33–36.
20. U.S. patent 5, 638, 178, “Imaging polarimeter detector for measurement of small spacings" (June 10, 1997).
21. M. Born and E. Wolf, Principles of Optics, 6th ed. (Pergamon, New York, 1980), pp. 62 and 40.
22. H. G. Tompkins, A User’s Guide to Ellipsometry (Academic, Boston, 1993), p. 17.
23. U.S. patent 5, 644, 562 to P. de Groot entitled “Method and apparatus for measuring and compensating birefringence in rotating disks" (July 1, 1997).
24. T. Fukuzawa, T. Hisano, K. Ikarugi, Y. Ozawa, H. Watabe, and K. Noda, “Two-dimensional flying-height measurement for new-generation heads, ” in Digest of the IEEE International Magnetics Conference (Institute of Electronical and Electronics Engineers, Piscataway, N.J., 1995), HC-01.