Mirror-image calibrator for resonant perturbation method in surface resistance measurements of high Tc superconducting thin films

Review of Scientific Instruments

Volumn 70, Issue 7, 1999, Pages 3092-3096

  Ong, C K ^a   Chen, Linfeng ^a   Lu, Jian ^a   Xu, S Y ^a   Rao, Xuesong ^a   Tan, B T G ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037750658     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149893     Document Type: Article

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