Sapphire resonator for the measurement of surface impedance of high-temperature superconducting thin films

Review of Scientific Instruments

Volumn 68, Issue 5, 1997, Pages 2121-2126

  Ormeno, R J ^a   Morgan, D C ^a,b   Broun, D M ^a   Lee, S F ^a,c   Waldram, J R ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^c UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; ELECTRIC IMPEDANCE MEASUREMENT; HIGH TEMPERATURE SUPERCONDUCTORS; NIOBIUM; SAPPHIRE; SURFACES; YTTRIUM COMPOUNDS;

SAPPHIRE DIELECTRIC RESONATORS; THERMAL ISOLATION; TRANSVERSE ELECTRIC MODE; YTTRIUM BARIUM COPPER OXIDE;

CRYSTAL RESONATORS;

EID: 0031143110     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1148106     Document Type: Article

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