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Volumn 206, Issue , 2003, Pages 1101-1105
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Ion-induced frequency shift of ∼1100 cm-1 IR vibration in implanted SiO2: Compaction versus bond-breaking
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Author keywords
Bond breaking; Coherent multi layer reflection model; Infrared reflection spectroscopy; Penetration effect; Radiation induced compaction; SiO2
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Indexed keywords
COMPACTION;
HEAVY IONS;
INFRARED RADIATION;
INFRARED SPECTROSCOPY;
SILICA;
BOND-BREAKING;
ION IMPLANTATION;
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EID: 0037736596
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(03)00919-4 Document Type: Conference Paper |
Times cited : (14)
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References (17)
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