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Volumn 4980, Issue , 2003, Pages 97-105
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Failure analysis of a multi-degree-of-freedom spatial microstage
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Author keywords
[No Author keywords available]
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Indexed keywords
DEGREES OF FREEDOM (MECHANICS);
ELECTROSTATIC ACTUATORS;
FAILURE (MECHANICAL);
FAILURE ANALYSIS;
MECHANISMS;
POLYSILICON;
POSITION CONTROL;
RELIABILITY;
MICROPOSITIONING MECHANISMS;
MICROELECTROMECHANICAL DEVICES;
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EID: 0037721345
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.478207 Document Type: Conference Paper |
Times cited : (3)
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References (6)
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